Reconstructıon of Large Facial Defects with Extended V-Y Flap
AHMET DUYMAZ, FURKAN KARABEKMEZ, MUSTAFA KESKİN, Mustafa Güçlü
- Yıl : 2008
- Cilt : 24
- Sayı : 2
- Sayfa :
97-103
Aim: Many options have been reported in reconstruction of the facial defects such as skin grafting, local flaps and free flaps. The extended V-Y flap, a modified V-Y advancement flap, is very useful in closing defects following excision of large facial lesions. Herein, we presented our 6 years experience for covering of the large facial defects with extended V-Y flaps. Material and Method: This procedure was applied to 27 patients with age ranging from 38 to 79 between 2001 and 2007. All operations were performed under local anaesthesia. The lesions were either squamous cell carcinomas, basal cell carcinomas, malignant melanoma, trichilemmoma, seborrheic keratosis or actinic keratosis and they were localized in the malar area, infraorbital area, lateral nasal aspect, the zygomatic area and the forehead. The size of the defects ranged from 3 x 3 cm to 6 x 5, 5 cm. Results: All of the flaps were achieved suitable closure of defects. The functional and aesthetic results were satisfactory for patients, and no tumor recurrence was observed during the 9 to 17 months follow-up period. Conclusion: Extended V-Y flap can be used reliably for the reconstruction of large facial tissue defects.
Atıf yapmak için :
Download Citation: Endnote/Zotero/Mendeley (RIS) RIS File
Download Citation: BibTeX BibTeX File
Açıklama :
Yazarların hiçbiri, bu makalede bahsedilen herhangi bir ürün,
aygıt veya ilaç ile ilgili maddi çıkar ilişkisine sahip değildir. Araştırma,
herhangi bir dış organizasyon tarafından desteklenmedi.Yazarlar çalışmanın
birincil verilerine tam erişim izni vermek ve derginin talep ettiği takdirde
verileri incelemesine izin vermeyi kabul etmektedirler.
Reconstructıon of Large Facial Defects with Extended V-Y Flap
2008,
Vol.
24
(2)
Geliş Tarihi : 18.01.2008,
Kabul Tarihi : 18.01.2008,
Yayın Tarihi : 30.09.2020
Selçuk Tıp Dergisi
ISSN:1017-6616;
E-ISSN:2149-8059;